Characterization of CuInS2 thin films prepared by electrodeposition and sulfurization with photoluminescence spectroscopy

Abstract

Potentiostatic electrodeposition and sulfurization techniques were used to prepare polycrystalline CuInS2 thin films. X-ray diffraction and photoresponse measurements in a photoelectrochemical cell (PEC) revealed that photoactive polycrystalline CuInS2 films can be deposited on Ti substrate. Photoluminescence (PL) spectroscopy was used to investigate the prepared thin films and optically characterize them. PL spectra revealed the defect structure of the samples with an acceptor energy level at 109 meV above the valance band and a donor energy level at 71 meV below the conduction band. The CuInS2 thin films prepared in this investigation are observed to be In-rich material with n-type electrical conductivity.