Electrodeposition and characterization of as-deposited and annealed CdTe thin films.

Abstract

Thin films of CdTe semiconductor materials were grown on fluorine doped tin oxide (FTO) conducting glass substrates using the technique of electrodeposition. CdSO4 at high concentrations and CdCl2, TeO2 at low concentrations were used as precursor salts for electrodeposition. The range of deposition potentials was estimated using cyclic voltammetric measurements. The electrical, optical, structural and morphological characteristics of as-deposited and annealed CdTe thin films were characterized using photo-electrochemical (PEC) cell studies, UV-Vis spectrophotometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM). These particular samples were converted from n-type into p-type after heat treatment. UV-Vis spectrometric measurements for CdTe layers indicated that, the energy band gaps of 1.45±0.02 eV for both as-deposited and annealed samples which exhibited the required optical property for fabricating CdS/CdTe solar cells. Little increase in (220) and (311) peaks of XRD spectra were observed for annealed layers compared to the as-deposited material. However, annealing exhibited a small reduction of cubic phase preferential orientation (111). The optical transmission for both as-deposited and annealed CdTe samples were about 60% for wavelengths longer than about 850 nm.