Growth and Characterization of Copper Indium Diselenide

dc.contributor.authorChithrani, B.D.en_US
dc.contributor.authorde Silva, K.T.L.en_US
dc.contributor.authorJayanetti, J.K.D.S.en_US
dc.contributor.authorSiripala, W.en_US
dc.date.accessioned2014-11-19T04:47:42Z
dc.date.available2014-11-19T04:47:42Z
dc.date.issued1996
dc.description.abstractCuInSe2 thin films were prepared on Ti plates by electrodeposition from an aqueous solution containing CuCl2, InCl3 and SeO2. The deposition was carried out at -0.5V Vs SCE. X-ray diffraction and Scanning electron microscopy have been used to study the crystallographic and morphological properties of the samples. Effects of annealing in air have also been monitored. Apparent bulk structure changes have been observed during annealing. Annealing of films at 350 0C was found to result in the formation of CuInSe2 films having a chalcopyrite structure, indicating that the samples are of good quality.en_US
dc.identifier.departmentPhysicsen_US
dc.identifier.urihttp://repository.kln.ac.lk/handle/123456789/4167
dc.publisherProceedings of the Technical Session of Institute of Physics, Sri Lankaen_US
dc.subjectCopperen_US
dc.subjectSri Lanka; Indium; Thin films; Diselenideen_US
dc.titleGrowth and Characterization of Copper Indium Diselenide
dc.typearticleen_US

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