Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth
dc.contributor.author | Kalingamudali, S.R.D. | en_US |
dc.contributor.author | Wismayer, A.C. | en_US |
dc.contributor.author | Woods, R.C. | en_US |
dc.contributor.author | Roberts, J.S. | en_US |
dc.date.accessioned | 2014-11-19T04:45:22Z | |
dc.date.available | 2014-11-19T04:45:22Z | |
dc.date.issued | 1994 | |
dc.description.abstract | Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter?mesas with an AlGaAs layer approximately 0.5 ?m thick. It was observed that the n=2 recombination current was reduced by ?90%, to about 10% of the original value, with a corresponding 13?fold increase in current gain for 270?20 ?m2 devices. In addition, devices with the same emitter?base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current. | en_US |
dc.identifier.department | Physics | en_US |
dc.identifier.issn | 0003-6951 (print) , 1077-3118 (online) | en_US |
dc.identifier.uri | http://repository.kln.ac.lk/jspui/handle/123456789/4052 | |
dc.publisher | Applied Physics Letters | en_US |
dc.subject | Current gain increase | en_US |
dc.subject | AIGaAs/GaAs heterojunction bipolar transistors | en_US |
dc.subject | Overgrowth; Kalinga | en_US |
dc.title | Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth | |
dc.type | article | en_US |
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