Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth

dc.contributor.authorKalingamudali, S.R.D.en_US
dc.contributor.authorWismayer, A.C.en_US
dc.contributor.authorWoods, R.C.en_US
dc.contributor.authorRoberts, J.S.en_US
dc.date.accessioned2014-11-19T04:45:22Z
dc.date.available2014-11-19T04:45:22Z
dc.date.issued1994
dc.description.abstractReduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter?mesas with an AlGaAs layer approximately 0.5 ?m thick. It was observed that the n=2 recombination current was reduced by ?90%, to about 10% of the original value, with a corresponding 13?fold increase in current gain for 270?20 ?m2 devices. In addition, devices with the same emitter?base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current.en_US
dc.identifier.departmentPhysicsen_US
dc.identifier.issn0003-6951 (print) , 1077-3118 (online)en_US
dc.identifier.urihttp://repository.kln.ac.lk/jspui/handle/123456789/4052
dc.publisherApplied Physics Lettersen_US
dc.subjectCurrent gain increaseen_US
dc.subjectAIGaAs/GaAs heterojunction bipolar transistorsen_US
dc.subjectOvergrowth; Kalingaen_US
dc.titleCurrent gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth
dc.typearticleen_US

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