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Computational Study of I-V characteristics of ITO/Cu2 O/Metal junctions, Technical Session of Institute of Physics

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dc.contributor.author Wijesinghe, W.M.P.L. en_US
dc.contributor.author Siripala, W. en_US
dc.contributor.author Jayasuriya, K.D. en_US
dc.contributor.author Kalingamudali, S.R.D. en_US
dc.date.accessioned 2014-11-19T04:47:41Z
dc.date.available 2014-11-19T04:47:41Z
dc.date.issued 1999
dc.identifier.uri http://repository.kln.ac.lk/handle/123456789/4165
dc.description.abstract A theoretical model for current-voltage (I-V) characteristics of back-to-back diode systems was developed using the ideal diode equation. A computer model was developed using the language C++ to fit the experimental data to the theoretical equation and to determine the ideality factors and reverse saturation currents of each diode. This model was tested with commercial back-to-back diode systems. The values obtained for the above parameters from the theoretical fits were in very good agreement with the standard values. The experimental I-V characteristics data obtained for fabricated ITO/Cu2O/Metal (Au, Ag and Hg) structures were fitted to the model and values for the relevent parameters were obtained. These values indicate that the fabricated systems are back to back diodes except the ITO//Cu2O/Hg structure. Using this model, a good understanding of I-V characteristics of metal-semiconductor-metal diodes can be gained and thereby the quality of junction devices can be tested. en_US
dc.publisher Processing of the Technical Session of Institute of Physics en_US
dc.subject Physics; Physics -Experiments; ITO/Cu2O; Metal junctions; Kalinga en_US
dc.title Computational Study of I-V characteristics of ITO/Cu2 O/Metal junctions, Technical Session of Institute of Physics
dc.type article en_US
dc.identifier.department Physics en_US


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