| dc.contributor.author |
Siripala W |
en_US |
| dc.contributor.author |
Tomkiewicz M |
en_US |
| dc.date.accessioned |
2014-11-19T04:45:40Z |
|
| dc.date.available |
2014-11-19T04:45:40Z |
|
| dc.date.issued |
1981 |
|
| dc.identifier.issn |
0013-4651(Print ) ,1945-7111(Online) |
en_US |
| dc.identifier.uri |
http://repository.kln.ac.lk/handle/123456789/4070 |
|
| dc.description.abstract |
Relaxation Spectrum Analysis was suggested as a general technique for mearsurements of charge accumulation modes and their corresponding relaxation times at the space charge layer of a semiconductor with strong emphasis
on semiconductor liquid junction interfaces. Among all the reported results(2-4),none was, as yet, confirmed by an independent technique. |
en_US |
| dc.publisher |
Journal of Electrochemical Society |
en_US |
| dc.subject |
Surface states |
en_US |
| dc.subject |
TiO2 |
en_US |
| dc.subject |
Electrolyte |
en_US |
| dc.title |
Direct Observation of Surface States at the TiO2 Electrolyte Interface |
|
| dc.type |
article |
en_US |
| dc.identifier.department |
Physics |
en_US |