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Characterization of CuInS2 thin films prepared by electrodeposition and sulfurization with photoluminescence spectroscopy

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dc.contributor.author Garuthara, R. en_US
dc.contributor.author Wijesundera, R.P. en_US
dc.contributor.author Siripala, W. en_US
dc.date.accessioned 2014-11-19T04:45:17Z
dc.date.available 2014-11-19T04:45:17Z
dc.date.issued 2003
dc.identifier.issn 0927-0248 en_US
dc.identifier.uri http://repository.kln.ac.lk/handle/123456789/4046
dc.description.abstract Potentiostatic electrodeposition and sulfurization techniques were used to prepare polycrystalline CuInS2 thin films. X-ray diffraction and photoresponse measurements in a photoelectrochemical cell (PEC) revealed that photoactive polycrystalline CuInS2 films can be deposited on Ti substrate. Photoluminescence (PL) spectroscopy was used to investigate the prepared thin films and optically characterize them. PL spectra revealed the defect structure of the samples with an acceptor energy level at 109 meV above the valance band and a donor energy level at 71 meV below the conduction band. The CuInS2 thin films prepared in this investigation are observed to be In-rich material with n-type electrical conductivity. en_US
dc.publisher Solar Energy Materials and Solar Cells en_US
dc.subject Photoluminescence; Polycrystalline CuInS2 en_US
dc.title Characterization of CuInS2 thin films prepared by electrodeposition and sulfurization with photoluminescence spectroscopy
dc.type Article en_US
dc.identifier.department Physics en_US


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