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Effects of annealing on the properties and structure of electrodeposited semiconducting Cu?O thin films

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dc.contributor.author Wijesundera, R.P. en_US
dc.contributor.author Hidaka, M. en_US
dc.contributor.author Koga, K. en_US
dc.contributor.author Sakai, M. en_US
dc.contributor.author Siripala, W. en_US
dc.contributor.author Choi Jae-Young en_US
dc.contributor.author Sung, N.E. en_US
dc.date.accessioned 2014-11-19T04:44:38Z
dc.date.available 2014-11-19T04:44:38Z
dc.date.issued 2007
dc.identifier.citation RP Wijesundera, M Hidaka, K Koga, M Sakai, W Siripala, Jae-Young Choi, Nark Eon Sung, 2007, Effects of annealing on the properties and structure of electrodeposited semiconducting Cu-O thin films, Physica Status of Solidi (b), 244 (12), pp. 4629-4642
dc.identifier.uri
dc.identifier.uri http://repository.kln.ac.lk/handle/123456789/3988
dc.description.abstract The structures and the electronic states in electrodeposited semiconductor Cu?O thin films have been investigated for each annealing temperature (TA) by X-ray diffraction (XD) and X-ray absorption spectroscopy (XAS) near the Cu K edge using synchrotron radiation. The thin films prepared as grown and annealed at TA ? 175 �C, 200 �C ? TA ? 300 �C, TA = 400 �C are characterized mainly by the pure Cu2O-type structure, the pseudo-Cu2O-type having a superlattice structure, and two phases of Cu2O-type and CuO-type structures, respectively, while the film annealed at TA = 500 �C is single-phase CuO-type. The XAS spectra suggest that there is a structural phase transition occurring at about 400 �C, which induces a modulation of the local structure around Cu ions observed in the extended X-ray absorption fine structure (EXAFS) and the occupational electronic band states of Cu-4p localized just above the Fermi level, taken from X-ray absorption near edge structure (XANES). The open-circuit voltage suggests that the photosensitivity of the Cu?O thin films strongly depends on the annealing treatment and shows a crossover from an n-type to a p-type semiconductor. (? 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) en_US
dc.publisher Physica Status Solidi (basic solid state physics) en_US
dc.title Effects of annealing on the properties and structure of electrodeposited semiconducting Cu?O thin films
dc.type article en_US
dc.identifier.department Physics en_US


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