Physics

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    Direct Observation of Surface States at the TiO2 Electrolyte Interface
    (Journal of Electrochemical Society, 1981) Siripala W; Tomkiewicz M
    Relaxation Spectrum Analysis was suggested as a general technique for mearsurements of charge accumulation modes and their corresponding relaxation times at the space charge layer of a semiconductor with strong emphasis on semiconductor liquid junction interfaces. Among all the reported results(2-4),none was, as yet, confirmed by an independent technique.