Siripala WTomkiewicz M2014-11-192014-11-1919810013-4651(Print ) ,1945-7111(Online)http://repository.kln.ac.lk/handle/123456789/4070Relaxation Spectrum Analysis was suggested as a general technique for mearsurements of charge accumulation modes and their corresponding relaxation times at the space charge layer of a semiconductor with strong emphasis on semiconductor liquid junction interfaces. Among all the reported results(2-4),none was, as yet, confirmed by an independent technique.Surface statesTiO2ElectrolytearticlePhysics