Kalingamudali, S.R.D.Wismayer, A.C.Woods, R.C.Roberts, J.S.2014-11-192014-11-1919940003-6951 (print) , 1077-3118 (online)http://repository.kln.ac.lk/jspui/handle/123456789/4052Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter?mesas with an AlGaAs layer approximately 0.5 ?m thick. It was observed that the n=2 recombination current was reduced by ?90%, to about 10% of the original value, with a corresponding 13?fold increase in current gain for 270?20 ?m2 devices. In addition, devices with the same emitter?base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current.Current gain increaseAIGaAs/GaAs heterojunction bipolar transistorsOvergrowth; KalingaCurrent gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowtharticlePhysics